The course starts with explaining the working principles of electron microscopes with a focus on transmission electron microscopy. The basic principles of crystal lattices and electron diffraction will be explained. Students will learn to describe the electron wave propagation and related approximations in crystalline materials. The concepts of aberration-corrected electron optics will be discussed before explaining the mechanisms of atomic resolution imaging by high resolution transmission electron microscopy and scanning transmission electron microscopy. With this knowledge students will learn how to interpret atomic resolution images and use computer simulations to gain quantitative insights in the atomic structure of solid-state materials. The course will then discuss emerging four-dimensional scanning transmission electron microscopy techniques to determine inner electric and magnetic fields in solid state materials. The students will gain first insights into advanced interferometric imaging methods such as electron ptychography to image the atomic structure of weak scattering objects (light elements). Electrontomography will be introduced and students will learn how to obtain three-dimensional information from samples down to the atomic level. The students will obtain knowledge in atomic level X-ray and electron energy loss spectroscopy and understand the principal concept of vibrational spectroscopy in the electron microscope. In the exercise the use of computer-based simulation and analysis tools will be introduced. Students will learn how to simulate and analyze complex multidimensional datasets.
- Kursleiter/in: Christian Liebscher