Advanced Characterisation Methods (Kurs-ID: 138070)

The lecture course STEM - ACM will be given in the English language. It is aimed at students of the Master’s programmes of Mechanical Engineering (special subjects: Materials Engineering and Micro-Engineering) and of the Master’s programme Materials Science and Simulation (MSS). The lecture course teaches the fundamentals that are essential for correct interpretation of microstructural results from electron-microscopic investigations. Tong Li will cover, in the first part of the course, the structure of matter, important crystallographic methods and the interaction between electrons and solids. In the second part of the course, Tong Li will introduce atom probe tomography (APT) and demonstrate how APT can be correlated with other microscopy techniques. In the third part of the course, Jan Frenzel will present the fundamentals and applications of scanning electron microscopy (SEM). Special emphasis will here be placed on orientation imaging microscopy (EBSD). In the fourth part, Christoph Somsen will explain the structure of a transmission electron microscope (TEM) and introduce contrast theory and analytical electron microscopy. In four exercises, integrated into the lecture plan, the subject matter will be consolidated and illustrated with practical examples.