The course builds on the lecture Physical Principles of Electron Microscopy (winter term), but this prior knowledge is not required. It focuses on advanced techniques in transmission electron microscopy.
It begins with a review of the fundamental principles of electron diffraction, scattering, and image formation. Building on this foundation, the course introduces aberration-corrected electron optics and explains the mechanisms enabling atomic-resolution imaging in both high-resolution transmission electron microscopy (HRTEM) and scanning transmission electron microscopy (STEM).
Students will learn how to interpret atomic-resolution images and apply computer simulations to extract quantitative information on the atomic structure of solid-state materials. The course then covers emerging techniques such as holography and four-dimensional STEM for mapping internal electric and magnetic fields in solids. Students will gain insight into advanced interferometric imaging methods, including electron ptychography, which enable imaging of weakly scattering materials and light elements with high precision.
The course also addresses spectroscopic techniques based on inelastic scattering. Students will develop a fundamental understanding of inelastic scattering processes and apply this knowledge to interpret energy-dispersive X-ray spectroscopy (EDX) and electron energy loss spectroscopy (EELS) at the atomic scale. In addition, the relationship between fundamental physical properties, electronic excitations, and their measurement with high spatial resolution will be discussed.
The accompanying exercises focus on practical aspects of these techniques and introduce students to computer-based simulation and data analysis tools.
- Kursleiter/in: Christian Liebscher