Content:
Overview of the use of electron beam methods for the analysis of solid materials. Electron – matter interaction (elastic scattering, inelastic scattering, production of X-rays, Auger electrons, and Cathodoluminescence). Construction principles and working of different instruments (TEM, SEM, EMPA, STEM, CL microscopes). Functionality of different parts of the instruments such as pumps, electron optic, generation of electron beams). Analytical methods and interpretation of analytical results (EELS, EBSD, electron optical images, EDX, WDX, diffraction images).
- Kursleiter/in: René Hoffmann
- Kursleiter/in: Niels Wolfgang Reinhold Jöns
Semester: ST 2024